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TI UCC27517AQDBVRQ1 STOCK

The UCC27517A-Q1 is a single-channel high-speed low-side gate driver designed to effectively drive MOSFET and IGBT switches. It features an inherently designed capability to greatly reduce shoot-through current, enabling it to sink and source high peak current pulses into capacitive loads while providing rail-to-rail drive capability and extremely small propagation delay (typically 13 ns). The device handles -5 V at the input and, when VDD = 12 V, delivers a peak 4-A sink/source symmetric drive current. It operates over a wide VDD range of 4.5 V to 18 V and a wide temperature range of -40°C to 140°C. An internal undervoltage lockout (UVLO) circuit on the VDD pin keeps the output low when VDD is outside the operating range. The device can operate at low voltages (for example, below 5 V) and offers best-in-class switching characteristics, making it well suited for driving newly emerging wide-bandgap power switching devices such as GaN power semiconductor devices. It is qualified for auto

Description:

The UCC27517A-Q1 single-channel high-speed low-side gate driver device effectively drives metal-oxide-semiconductor field-effect transistor (MOSFET) and insulated-gate bipolar transistor (IGBT) switches. By virtue of an inherently designed capability to greatly reduce shoot-through current, the UCC27517A-Q1 is capable of sinking and sourcing high peak current pulses into capacitive loads, which provides rail-to-rail drive capability and extremely small propagation delay (typically 13 ns). The UCC27517A-Q1 device handles -5 V at the input. When VDD = 12 V, the UCC27517A-Q1 can provide a peak 4-A sink/source (symmetric drive) current drive capability. The UCC27517A-Q1 operates over a wide VDD range of 4.5 V to 18 V and a wide temperature range of -40°C to 140°C. The internal undervoltage lockout (UVLO) circuit on the VDD pin keeps the output low when VDD is outside the operating range. This device is capable of operating at low voltages (for example, below 5 V) and has the best-in-class switching characteristics, making it very suitable for driving newly emerging wide-bandgap power switching devices such as GaN power semiconductor devices.


Features:


Qualified for automotive applications with the following results in accordance with AEC-Q100:


125°C ambient operating temperature range


Device temperature grade 1 for automotive applications: -40°C to Grade 2


Device human body model (HBM) electrostatic discharge (ESD) classification


High-quality alternative to discrete solutions


Device charged device model (CDM) ESD classification level C6


Low-cost gate driver device provides an NPN and PNP discrete solution


4-A peak source and sink symmetric drive


Capable of handling negative voltage (-5 V) at the input


Fast propagation delay (typical 13 ns)


Fast rise and fall times (typical 9 ns and 7 ns)


4.5-V to 18-V single supply


Glitch-free pulse operation during power-up and power-down


Output held low during VDD undervoltage lockout (UVLO) (ensures


TTL- and CMOS-compatible logic thresholds (independent of supply voltage)


Hysteretic logic thresholds for high noise immunity


Dual-input design (select either an inverting (IN- pin) or non-inverting (IN+ pin) driver configuration)


An unused input pin can be used for enable or disable function


Output remains low when the input pin is floating


The maximum absolute voltage level of the input pin is not limited by the VDD pin bias supply voltage


-40°C to 140°C operating temperature range option


5-pin DBV (small outline transistor (SOT)-23) package


Applications:


Automotive


Switch-mode power supplies


DC-to-DC converters


Companion gate driver devices for digital power controllers


Solar, motor control, uninterruptible power supplies (UPS)


Gate drivers for newly emerging wide-bandgap power devices (such as GaN)


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